Infineon Technologies 165-FBGA CY7C1613KV18-300BZXC

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The CY7C1613KV18-300BZXC is a high-speed Static Random Access Memory (SRAM) from Cypress Semiconductor, featuring a 16Mbit capacity and a data rate of up to 300 MHz. This device adheres to the IEEE 1149.1 standard for Serial Boundary Scan (JTAG) testability, incorporating a Test Access Port (TAP) for efficient testing and debug. It is designed for applications demanding high-performance memory with built-in JTAG support for improved board-level test coverage.