Infineon Technologies 165-FBGA CY7C1413KV18-300BZXC

The CY7C1413KV18-300BZXC is a high-speed Static Random Access Memory (SRAM) from Cypress Semiconductor, featuring a 300 MHz operational speed and built-in IEEE 1149.1 (JTAG) boundary scan capability for efficient testing and debug. This device offers a serial test access port (TAP) in compliance with the JTAG standard to simplify board-level testing. It belongs to a series of SRAMs designed for high-performance applications where fast data transfer rates and robust testability are critical requirements.